1MHz to 600MHz Measurement Frequency Impedance Analyzer with 0.5ms Test Speed
IMPEDANCE ANALYZER IM7583
Hioki LCR Meters and Impedance Analyzers range from 1mHz to 3GHz devices to suit a wide range of applications in the testing of electronic components. The IM7583 offers a top measurement time of 0.5ms over a 1MHz to 600MHz frequency range, making it ideal for high volume production of ferrite chip beads and chip inductors.
• 1 MHz to 600 MHz testing source frequency
• Fastest test speed of 0.5 msec (Analog measurement time)
• ±0.65% rdg. basic accuracy
• Half-rack size body and palm-sized test head
• Comprehensive contact check (via DCR testing, Hi-Z reject or waveform judgment)
• Make frequency sweeps, level sweeps and time interval measurements in Analyzer Mode
IMPEDANCE ANALYZER IM7580 series：LCR Measurement Using the SMD Test Fixture IM9201
The IM7580 series encompasses five models covering measurement frequencies of 1 MHz to 3 GHz. Used in combination with the Test Fixture IM9201, which can accommodate six SMD sizes, IM7580 series instruments allow you to measure specimens easily and reliably.
IMPEDANCE ANALYZER IM7580 series：Comparator function
A comparator function lets you check whether measured values fall within a user-defined judgment range. This functionality is ideal for use in generating PASS/FAIL judgments for specimens.
IMPEDANCE ANALYZER IM7580 series：Contact check function
The instruments’ contact check function lets you check contact between the specimen and measurement terminals to detect faulty contact or verify good contact.
IMPEDANCE ANALYZER IM7580 series：How to connect the test head
Connect the cable of the test head to the impedance analyzer.
Tighten the nut until the handle of the torque wrench bends slightly.
Do not over tighten.
Download the sample application and view the Communications Command User Manual.
Basic specifications (Accuracy guaranteed for 1 year, Post-adjustment accuracy guaranteed for 1 year)
|Measurement modes||LCR mode, Analyzer mode (Sweeps with measurement frequency and measurement level), Continuous measurement mode|
|Measurement parameters||Z, Y, θ, Rs (ESR), Rp, X, G, B, Cs, Cp, Ls, Lp, D (tanδ), Q|
|Measurable range||100 mΩ to 5 kΩ|
|Display range||Z: 0.00 m to 9.99999 GΩ / Rs, Rp, X: ± (0.00 m to 9.99999 GΩ)
Ls, Lp: ± (0.00000 n to 9.99999 GH) / Q: ± (0.00 to 9999.99)
θ: ± (0.000° to 180.000°), Cs, Cp: ± (0.00000 p to 9.99999 GF)
D: ± (0.00000 to 9.99999), Y: (0.000 n to 9.99999 GS)
G, B: ± (0.000 n to 9.99999 GS), Δ%: ± (0.000 % to 999.999 %)
|Basic accuracy||Z: ±0.65 % rdg. θ: ±0.38°|
|Measurement frequency||1 MHz to 600 MHz (100 kHz setting resolution)|
|Measurement signal level||Power: -40.0 dBm to +1.0 dBm
Voltage: 4 mV to 502 mVrms
Current: 0.09 mA to 10.04 mArms
|Output impedance||50 Ω (at 10 MHz)|
|Display||8.4-inch color TFT with touch screen|
|Measurement speeds||FAST: 0.5 ms (Analog measurement time, typical value)|
|Functions||Contact check, Comparator, BIN measurement (classification), Panel loading/saving, Memory function, Equivalent circuit analysis, Correlation compensation|
|Interfaces||EXT I/O (Handler), USB communication, USB memory, LAN, RS-232C (optional), GP-IB (optional)|
|Power supply||100 to 240 V AC, 50/60 Hz, 70 VA max.|
|Dimensions and mass||Main unit: 215 mm (8.46 in) W × 200 mm (7.87 in) H × 348 mm (13.70 in) D, 8.0 kg (282.2 oz)
Test head: 90 mm (3.54 in) W × 64 mm (2.52 in) H × 24 mm (0.94 in) D, 300 g (10.58 oz)
|Accessories||Test head ×1, Connection cable ×1, Instruction manual ×1, LCR application disc (Communications user manual) ×1, Power cord ×1|