Flying Probe In-circuit Tester



Hioki PCB and substrate inspection equipment leverages our core competency in high precision component testing. The FA1240 series is a 4-arm populated board inspection tool that delivers multi-functional testing in as fast as 0.025 sec./step.


Key Features

• Quickly complete programs that take into account component height
• Automatically calculate arm interference (when used with the UA1780)
• Designed to improve probe replaceability, dramatically reducing system downtime caused by probe replacement
• High-speed testing at up to 0.025 sec./step
• Detect IC lead float and pseudo-contact states
• Support for active testing (optional feature)
• High-precision probing
• Large testing area of 510 × 460 mm (FA1240-61)
• Standard transport capability
• Automatic alignment function and simple visual test function


CE Compliant model: FA1241-61

Model No. (Order Code)

FA1240-61 For large boards
FA1240-63 For medium rack boards
FA1241-61 CE compliant model, for large boards



Electrical Testing Verifies Correct Mounting

Create a program from the design data, perform electrical testing with minimal time and cost, and quickly confirm and record defects.



Lead float and pseudo-contact are not the same thing.

Pseudo-contact of leads is a type of defect that may slip through various tests during the board manufacturing process and make its way into the market.

Lead float can be fairly reliably identified by today's image inspection technology.Consequently, Hioki's proprietary resistance measurement pseudo-contact test serves to detect pseudo-contact, which is difficult to identify based on appearance alone.


Focusing on the supreme importance of test points and Gerber data

It's half true, and half untrue, to say that the ability to easily create data is distinct from the ability to easily test boards. Being able to create data easily may have meant being able to test boards easily during the discrete era, but in creating the test data required by the FA1240, it is critical that creating accurate test data be a simple and easy-to-perform process.
By minimizing the difference between data that's good enough to operate the tester and data that's good enough to ship products, it is possible to minimize production line downtime (to allow for debugging and other modifications) and to ship products with peace of mind.


Simply follow the workflow.

Quickly complete programs that take into account component height



Automatic calculation of arm interference (when used with the UA1780)

Do you check data by looking at probe tips and asking yourself whether they'll strike components on the board or not?

In fact, choosing probes used to be a demanding and time-consuming part of the debugging process that required a high degree of care. By adding component height information to mounting data, the FA1240 is able to automatically select an appropriate test probe, allowing you to approach the task of debugging electrical testing with peace of mind.



Long-life probes (easy replacement NEW and long service life)

The tips of Hioki's new super-hard probes show no wear, even after 3 million contact cycles.
Stable contact for up to 3,000,000 uses, prevents pseudo-contact due to slips



[Program,Test, Visualize] Populated Board Electrical Testing System

Hioki can prepare populated board testing system benchmarks if provided with the three types of data listed below.

[Program] FIT-LINE UA1780
[Visualize] FAIL VISUALIZER UA1782

When testing populated boards, it's essential to create accurate data, measure boards accurately, and identify defective locations accurately.



Specifications Overview

Number of arms 4 (L, ML, MR, R)
Number of test steps 40,000 (max.)
Measurement ranges Resistance: 400 μΩ to 40 MΩ
Capacitance: 1 pF to 400 mF
Inductance: 1 μH to 100 H
Diode VZ measurement: 0 to 25 V
Zener diode VZ measurement: 0 to 25 V, 25 to 80 V (optional feature)
Digital transistors: 0 to 25 V
Photo couplers: 0 to 25 V
Short: 0.4 Ω to 400 kΩ
Open: 4 Ω to 40 MΩ
DC voltage measurement: 0 to 25 V
Measurement time Max. 0.025 sec./step Max. 0.025 sec./step
Probing precision Within ±100 μm for each arm (X and Y directions)
Positioning repeatability Within ±50 μm (probing positions)
Inter-probe pitch Min. 0.15 mm
Min. 0.5 mm (when using 4-terminal probes)
Min. 0.15 mm
Min. 0.5 mm (when using 4-terminal probes)
Testable board dimensions 510 mm (20.08 in) W × 460 mm (18.11 in) D 400 mm (15.75 in) W × 330 mm (12.99 in) D
Power supply 200 V AC (single-phase), 50/60 Hz, 6 kVA (FA1241: 230 V AC) 200 V AC (single-phase), 50/60 Hz,
5 kVA
Dimensions and mass 1406 mm (55.35 in) H × 1300 mm (51.18 in) H × 1380 mm (54.33 in) D, 1150 kg (40,564.4 oz) 1266 mm (49.84 in) H × 1369 mm (53.90 in) H × 1425 mm (56.10 in) D, 1050 kg (37,037 oz)


EV Battery Application FA1240-6x

FA1240-6x Brochure


Probe series CP series, 1160/1161series, 1171/1172series

Populated Board Electrical Testing System





• Generate high-quality board testing data without physical boards

Application FA1240-6x_02 (English)

Application 3_FA1240_Improvement of contractibility for small chips

Application 1 FA1240 Mounting Verification_E03

Application 2 FA1240_MLCC crack_e011

Applicatoin 5 FA1240_VG Short Detecting_E01

There are no drivers, firmware or software available for this product.