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FLYING PROBE TESTER FA1240-6x

Flying Probe In-circuit Tester

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Description

Hioki PCB and substrate inspection equipment leverages our core competency in high precision component testing. The FA1240 series is a 4-arm populated board inspection tool that delivers multi-functional testing in as fast as 0.025 sec./step.

 

Key Features

• Quickly complete programs that take into account component height
• Automatically calculate arm interference (when used with the UA1780)
• Designed to improve probe replaceability, dramatically reducing system downtime caused by probe replacement
• High-speed testing at up to 0.025 sec./step
• Detect IC lead float and pseudo-contact states
• Support for active testing (optional feature)
• High-precision probing
• Large testing area of 510 × 460 mm (FA1240-61)
• Standard transport capability
• Automatic alignment function and simple visual test function

 

CE Compliant model: FA1241-61

Model No. (Order Code)

FA1240-61For large boards
FA1240-63For medium rack boards
FA1241-61CE compliant model, for large boards
CE

 

High-speed, fixture-less automatic testing of battery modules

Bringing technology …to battery module testing for probing populated board to battery module testing.
HIOKI’s Flying Probe Tester FA1240 delivers high-speed, high-precision, fixture-less testing of battery modules with four flying probes.

 

Electrical Testing Verifies Correct Mounting

Create a program from the design data, perform electrical testing with minimal time and cost, and quickly confirm and record defects.

 

 

Lead float and pseudo-contact are not the same thing.

Pseudo-contact of leads is a type of defect that may slip through various tests during the board manufacturing process and make its way into the market.

Lead float can be fairly reliably identified by today's image inspection technology.Consequently, Hioki's proprietary resistance measurement pseudo-contact test serves to detect pseudo-contact, which is difficult to identify based on appearance alone.

 

Focusing on the supreme importance of test points and Gerber data

It's half true, and half untrue, to say that the ability to easily create data is distinct from the ability to easily test boards. Being able to create data easily may have meant being able to test boards easily during the discrete era, but in creating the test data required by the FA1240, it is critical that creating accurate test data be a simple and easy-to-perform process.
By minimizing the difference between data that's good enough to operate the tester and data that's good enough to ship products, it is possible to minimize production line downtime (to allow for debugging and other modifications) and to ship products with peace of mind.

 

Simply follow the workflow.

Quickly complete programs that take into account component height

 

 

Automatic calculation of arm interference (when used with the UA1780)

Do you check data by looking at probe tips and asking yourself whether they'll strike components on the board or not?

In fact, choosing probes used to be a demanding and time-consuming part of the debugging process that required a high degree of care. By adding component height information to mounting data, the FA1240 is able to automatically select an appropriate test probe, allowing you to approach the task of debugging electrical testing with peace of mind.

 

 

Long-life probes (easy replacement NEW and long service life)

The tips of Hioki's new super-hard probes show no wear, even after 3 million contact cycles.
Stable contact for up to 3,000,000 uses, prevents pseudo-contact due to slips

 

 

[Program,Test, Visualize] Populated Board Electrical Testing System

Hioki can prepare populated board testing system benchmarks if provided with the three types of data listed below.

[Program] FIT-LINE UA1780
[Test] FLYING PROBE TESTER FA1240
[Visualize] FAIL VISUALIZER UA1782

When testing populated boards, it's essential to create accurate data, measure boards accurately, and identify defective locations accurately.

 

 

Specifications Overview

 FA1240-61
FA1241-61
FA1240-63
Number of arms4 (L, ML, MR, R)
Number of test steps40,000 (max.)
Measurement rangesResistance: 400 μΩ to 40 MΩ
Capacitance: 1 pF to 400 mF
Inductance: 1 μH to 100 H
Diode VZ measurement: 0 to 25 V
Zener diode VZ measurement: 0 to 25 V, 25 to 80 V (optional feature)
Digital transistors: 0 to 25 V
Photo couplers: 0 to 25 V
Short: 0.4 Ω to 400 kΩ
Open: 4 Ω to 40 MΩ
DC voltage measurement: 0 to 25 V
Measurement timeMax. 0.025 sec./stepMax. 0.025 sec./step
Probing precisionWithin ±100 μm for each arm (X and Y directions)
Positioning repeatabilityWithin ±50 μm (probing positions)
Inter-probe pitchMin. 0.15 mm
Min. 0.5 mm (when using 4-terminal probes)
Min. 0.15 mm
Min. 0.5 mm (when using 4-terminal probes)
Testable board dimensions510 mm (20.08 in) W × 460 mm (18.11 in) D400 mm (15.75 in) W × 330 mm (12.99 in) D
Power supply200 V AC (single-phase), 50/60 Hz, 6 kVA (FA1241: 230 V AC)200 V AC (single-phase), 50/60 Hz,
5 kVA
Dimensions and mass1406 mm (55.35 in) H × 1300 mm (51.18 in) H × 1380 mm (54.33 in) D, 1150 kg (40,564.4 oz)1266 mm (49.84 in) H × 1369 mm (53.90 in) H × 1425 mm (56.10 in) D, 1050 kg (37,037 oz)

Others

EV Battery Application FA1240-6x

FA1240-6x Brochure

Options

Options

 

FIT-LINE INSPECTION DATA CREATION SYSTEM UA1780

• Generate high-quality board testing data without physical boards

Application FA1240-6x_02 (English)

Application 3_FA1240_Improvement of contractibility for small chips

Application 1 FA1240 Mounting Verification_E03

Application 2 FA1240_MLCC crack_e011

Applicatoin 5 FA1240_VG Short Detecting_E01

There are no drivers, firmware or software available for this product.