Product Categories

    • C, D (tan δ), high capacitance MLCC testing 120Hz or 1kHz 2 ms measurement time

    Dual-band 120Hz/1kHz Capacitance Meter for High Speed Inspection of Multi-Layer Ceramic Capacitors (MLCC) on Taping Machines

    C HiTESTER 3504

    • C, D (tan δ), Q, and low capacitance testing 1 kHz, 1 MHz 1.5 ms measurement time at 1 MHz

    Dual-band 1kHz/1MHz Capacitance Meter for High Speed Testing of Ceramic Capacitors on Production Lines

    C METER 3506-10

    • |Z|, L, C, R testing 120Hz or 1kHz 5 ms measurement time

    Compact, dual-band 120Hz/1kHz LCR Meter for Integration into Automated Production Lines

    LCR HiTESTER 3511-50