Product Categories
Impedance Analyzers, up to 3 GHz
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- |Z|, L, C, R, σ, ε testing Battery measurement 1 mHz to 200 kHz 2 ms measurement time
For R & D applications of Electrochemical Components and Materials, Batteries, and EDLCs
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- Optional software for Model IM3570 5 equivalent circuit models Plot frequency characteristics graph from analysis results Cole-Cole plot, admittance circle display
Simple Circuit Analysis & Detailed Acceptance/Rejection Decision-Making
Firmware Upgrade for the IM3570
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- |Z|, L, C, R testing 4 Hz to 5 MHz 0.5 ms measurement time Measure LCR and conduct frequency sweeps simultaneously
Single Device Solution for High Speed Testing and Frequency Sweeping
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- |Z|, L, C, R testing Testing source frequency: 1 MHz to 300 MHz Measuring time: 0.5 ms Measure LCR and conduct frequency sweeps simultaneously
1MHz to 300MHz Measurement Frequency Impedance Analyzer with 0.5ms Test Speed and Superior Repeatability
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- |Z|, L, C, R testing Testing source frequency: 100 kHz to 300 MHz Measuring time: 0.5 ms Measure LCR and conduct frequency sweeps simultaneously
100kHz to 300MHz Measurement Frequency Impedance Analyzer with 0.5ms Test Speed
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- |Z|, L, C, R testing Testing source frequency: 1 MHz to 600 MHz Measuring time: 0.5 ms Measure LCR and conduct frequency sweeps simultaneously
1MHz to 600MHz Measurement Frequency Impedance Analyzer with 0.5ms Test Speed
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- |Z|, L, C, R testing Testing source frequency: 1 MHz to 1.3 GHz Measuring time: 0.5 ms Measure LCR and conduct frequency sweeps simultaneously
1MHz to 1.3GHz Measurement Frequency Impedance Analyzer with 0.5ms Test Speed and 0.07% Variability
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- |Z|, L, C, R testing Testing source frequency: 1 MHz to 3 GHz Measuring time: 0.5 ms Measure LCR and conduct frequency sweeps simultaneously
1MHz to 3GHz Measurement Frequency Impedance Analyzer with 0.5ms Test Speed and 0.07% Variability
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- Direct connection two-terminal measurement type DC to 3 GHz Measurable sample sizes: 0201 to 1210 (EIA)
3GHz High Frequency Test Fixture for 6 Different SMD Sizes
LCR Meters | Capacitance Meters, 1 kHz, 120 Hz
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- C, D (tan δ), high capacitance MLCC testing 120Hz or 1kHz 2 ms measurement time
Dual-band 120Hz/1kHz Capacitance Meter for High Speed Inspection of Multi-Layer Ceramic Capacitors (MLCC) on Taping Machines
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- C, D (tan δ), Q, and low capacitance testing 1 kHz, 1 MHz 1.5 ms measurement time at 1 MHz
Dual-band 1kHz/1MHz Capacitance Meter for High Speed Testing of Ceramic Capacitors on Production Lines
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- |Z|, L, C, R testing 120Hz or 1kHz 5 ms measurement time
Compact, dual-band 120Hz/1kHz LCR Meter for Integration into Automated Production Lines
LCR Meters, 200 kHz to 8 MHz
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- |Z|, L, C, R testing Testing source frequency: 40 Hz to 200 kHz Measuring time: 2 ms
Ideal for Production Lines of Electronic Parts and Automated Testing
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- |Z|, L, C, R testing Testing source frequency: 1 mHz to 200 kHz Measuring time: 2 ms Transformer measurement mode
From R&D Applications to Windings, Coil and Transformer Manufacturing
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- |Z|, L, C, R testing Testing source frequency: DC, or 4 Hz to 8 MHz Measuring time: 1 ms Accuracy guaranteed range from 1mΩ
General-Purpose LCR Meters with Measurement Frequency from DC, 4Hz to 8MHz