Product Categories
Bare Board Testing (flying probe tester)
-
- Dedicated visualization software for Hioki electrical testing equipment and data creation systems
Robust Support for Repair Work Using Simple Operations and Assistive Functionality
-
- 3-in-1 for editing, test-point generation, and built-in component support New Windows-optimized algorithm Free from data volume restrictions for increased freedom Added new commands to reduce data generation time by half
1/2 Data Generation Time With New Platform
-
- Reduced-impact link probes CP1072-01(option) Laser height-adjustment Unit FA1950-06(option) Reduced fine pattern test times High-speed pattern testing using capacitance measurement
High-speed Testing at Up to 100 Points/sec. with Half the Impact Mark Depth
-
- High-precision probing Max.100 steps/s ultra-high speed inspection Reliable clamping of thin boards
Robust Support for Testing Boards with Embedded Passive and Active Devices through High-Speed, Double-Sided Testing
-
- High-precision probing Max.100 points/s ultra-high speed inspection
Complete Electrical Testing of High-Function Boards with a Single Unit
-
- Double-sided bare board testing 0.012s/step measurement speed
Double-sided Board Tester with Maximum Measurement Speed of 0.012s/Step
Bare Board Testing with test fixture
-
- Emdedded passives/actives test HDI via resistance Known-good reference values for wiring pattern resistance
All-In-One Solution for Testing the Reliability of Connections on Printed Circuit Boards
-
- Double-sided alignment and built-in handler
Semiconductor Package Board Testing System Utilizing Index Table Method
-
- Double-sided alignment 340 × 330 mm working area
High-Precision Batch Fixture-Type Testing System that Support Boards with Embedded Passive and Active Devices
-
Robust Support for Testing Device Embedded Substrates
Data Creation Software
-
- 3-in-1 for editing, test-point generation, and built-in component support New Windows-optimized algorithm Free from data volume restrictions for increased freedom Added new commands to reduce data generation time by half
1/2 Data Generation Time With New Platform
-
- Generate high-quality board testing data without physical boards
90% Faster Data Generation, 93% Lower Line Stoppage Times
Populated Board Testing
-
- Dedicated visualization software for Hioki electrical testing equipment and data creation systems
Robust Support for Repair Work Using Simple Operations and Assistive Functionality
-
- Quickly complete programs that take into account component height Automatic calculation of arm interference
Flying Probe In-circuit Tester
-
- In-circuit test
- 4-terminal testing
- High-current/high-voltage diode testing
- Impedance
- High-speed testing of multi-board layouts
High Performance Populated Board Testing with Expansion Capabilities
The Power to Connect
-
Continuing to create new solutions together