IM7585 Impedandance Analyzer: 1 MHz to 1.3 GHz
Instruments measure at frequencies of up to 600 MHz (IM7583) and 1.3 GHz (IM7585)
August 20, 2015 - Nagano, Japan
Hioki is pleased to announce the launch of the Impedance Analyzer IM7583 and IM7585.
As today’s information-driven society continues to develop and mobile devices such as smartphones gain LTE, WiFi, and GPS capability, handset operating frequencies are increasing and even reaching the gigahertz band. This trend is pushing up the operating frequencies of electronic components such as high-frequency inductors and ferrite chip beads that are used in mobile devices. Since manufacturers need to conduct shipping inspections of these components at high frequencies that range from several hundred megahertz to 1 GHz, demand for high-frequency measuring instruments has grown.
The newly launched IM7583 and IM7585 deliver high-frequency measurement capabilities that go beyond those of the IM7580, which was launched last year with high-frequency measurement capability up to 300 MHz. Both instruments are able to test today’s increasingly high-frequency electronic components, with the IM7583 offering measurement frequencies ranging from 1 MHz to 600 MHz and the IM7585 from 1 MHz to 1.3 GHz.
Both the IM7583 and the IM7585 can quickly test large quantities of electronic components thanks to high-speed performance with measurement times as short as 0.5 ms (0.0005 sec.), highlighting their ability to boost productivity for component manufacturers.
* Shipping inspections, acceptance inspections and characteristic evaluation of electronic components such as high frequency inductors and ferrite chip beads
1. High-frequency measurement at up to 600 MHz (IM7583) or 1.3 GHz (IM7585)
The IM7583 and IM7585 offer measurement frequencies ranging from 1 MHz to 600 MHz and from from 1 MHz to 1.3 GHz, respectively. Both of these ranges far outstrip the measurement frequency range of the IM7580 that was launched last year (1 MHz to 300 MHz).
LCR meter mode, which makes measurements at a single frequency, is ideal for identifying defective components, while analyzer mode, which makes measurements while varying the frequency, can be used to evaluate characteristics during the product development process. In this way, the instruments can be used in a variety of fields and applications.
2. Improved productivity thanks to high-speed measurement in as little as 0.5 ms and high-stability measurement
The IM7583 and IM7585 deliver high-speed measurement in as little as 0.5 ms (0.0005 sec.). This level of performance can dramatically boost productivity for electronic component manufacturers that need to quickly test large volumes of electronic components.
In addition, measurement repeatability is 0.07% (representative value at 1 GHz) for the IM7585, highlighting the instrument’s ability to deliver stable measurement in order to improve manufacturing yields and raise productivity.
3. Compact footprint to help reduce production costs
Electronic component manufacturers create automated testing systems for use on production lines by mounting instruments on racks. By delivering the IM7583 and IM7585 with the same compact footprint as last year’s IM7580, Hioki is making it possible for operators to implement compact testing systems and to shorten testing times by incorporating multiple instruments. The ultimate result of this innovation is lower production costs.
4. Extensive functionality for generating pass/fail judgments
In LCR meter mode, which makes measurements at a single frequency, the instruments provide a comparator function for generating pass/fail judgments for electronic components and a BIN function for sorting components. The comparator function uses operator-specified upper and lower limit values as the judgment standard. Whereas the comparator function makes pass/fail judgments against a single judgment standard, the BIN function allows operators to program up to 10 judgment standards and then ranks components against them.
Analyzer mode, which makes measurements at multiple frequencies, offers area and peak judgment as methods for making pass/fail judgments based on electronic components’ frequency characteristics. Area judgment is used to verify whether measured values fall within a preconfigured judgment area, while peak judgment is used to determine resonance points.
The instruments also offer a new spot judgment function that makes pass/fail judgments based on multiple frequencies set by the operator.
Basic accuracy: Z: +/-0.65% rdg. theta: +/-0.38deg. (representative values)
Measurement time: As low as 0.5 ms (analog measurement)
Measurement range: 100 mOhm to 5kOhm
Measurement frequencies: IM7583: 1 MHz to 600 MHz / IM7585: 1 MHz to 1.3 GHz
Measurement signal level: -40.0 dBm to +1.0 dBm (4 mV to 502 mV)
Established in 1935, HIOKI E.E. CORPORATION (TSE: 6866) has grown to become a world leader in providing consistent delivery of test and measuring instruments through advanced design, manufacturing, and sales and services. By offering over 200 main products characterized by safety and quality while meeting an expansive range of applications, we aim to contribute to the efficiency and value of our customers' work in research and development, production and electrical maintenance. HIOKI products and services are available around the world through our extensive network of subsidiaries and distributors. Information about HIOKI is available at https://hiokiusa.com.