Hioki IM7580 Impedance Analyzer


1MHz to 300MHz Operating Frequency

Nagano, Japan

Hioki is pleased to announce the launch of the Impedance Analyzer IM7580.

As our society continues to become increasingly information-oriented, the speed of data transmission lines using technologies such as high-speed differential transmission to send and receive large amounts of data continues to increase. At the same time, increasingly high-frequency designs are being used for the common-mode filters and ferrite-core filters employed to improve skew (delay time shift) and reduce noise on those high-speed transmission lines.

The IM7580, which can perform measurement at high frequencies of up to 300 MHz, can be used to measure these increasingly high-frequency electronic components. At the same time, the instrument can significantly boost productivity for electronic component manufacturers thanks to its ability to test large volumes of components at measurement speeds as fast as 0.5 ms (0.0005 sec.).

Development Background
Transmission lines that use high-speed differential transmission and other technologies to send and receive large amounts of data are relying increasingly on high-frequency designs. Electronic components such as common-mode filters and ferrite-core filters are employed to maintain signal quality while limiting noise on such lines, and the increasingly high speeds at which the lines operate demand higher-frequency designs for those components as well.

At the same time, increasingly compact power supplies are needed to facilitate the ongoing miniaturization of mobile phones and laptop computers. Increasing the switching frequency of DC-DC converters offers one means of accommodating such requirements, leading to higher-frequency designs for power inductors and other electronic components that are used in those power supplies.

Electronic component manufacturers that produce these parts need to perform measurement at high frequencies as part of the development process and in order to carry out shipping inspections. To increase production volume during shipping inspections, measuring instruments must operate at high speeds.

Based on these needs, Hioki developed an impedance analyzer capable of testing at high frequencies and high speeds.

Principal Applications
* Shipping inspections of electronic components carried out by manufacturers
* Acceptance inspections and evaluation of characteristics of electronic components carried out by manufacturers

Product Features
1. High-speed, 300 MHz high-frequency measurement
The IM7580 can perform measurement at frequencies ranging from 1 MHz to 300 MHz. Operating in LCR Mode, in which measurements are performed at a single frequency, the impedance analyzer can be used to generate PASS and FAIL results during shipping inspections. Operating in Analyzer Mode, in which the frequency is varied while performing measurement, the analyzer can be used to evaluate characteristics in product development and a variety of other applications.

2. Productivity gains from highly stable, high-speed measurement at speeds as fast as 0.5 ms
The IM7580 can perform high-speed measurement at speeds as fast as 0.5 ms (0.0005 sec.). For electronic component manufacturers that wish to test large volumes of parts more quickly, this speed advantage can yield a significantly boost to productivity.

In addition, measurement repeatability has been increased by a factor of 10 from the legacy Hioki model, enabling stable measurement, improving production yields, and boosting productivity.

3. Compact footprint for lower production costs
Electronic component manufacturers build automatic testing systems on their production lines by installing various types of devices in equipment racks. Smaller equipment means more compact testing systems, and the ability to mount multiple instruments in less space reduces testing times, lowering production costs.

Thanks to the instrument’s half-rack size (215 [W] x 200 [H] x 268 [D] mm), two IM7580 units can fit into a standard-width rack.

4. PASS/FAIL judgments based on a variety of judgment functions
LCR Mode, in which measurements are performed at a single frequency, provides comparator functionality for generating PASS/FAIL judgments for electronic components as well as bin functionality for sorting components. The comparator function allows customers to set upper and lower limits and then generates PASS/FAIL results based on those criteria. Where the comparator function generates judgments based on one set of criteria, the bin function allows users to set up to 10 sets of judgment criteria and then ranks parts accordingly.

Analyzer Mode, in which the frequency is varied while performing measurement, provides area and peak comparison functionality for generating PASS/FAIL judgments based on electronic components’ frequency characteristics. Area judgment allows users to verify that measured values fall within a previously configured judgment area, while peak judgment allows users to detect resonance points based on previously configured upper, lower, left, and right limits.

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About HIOKI
Established in 1935, HIOKI E.E. CORPORATION (TSE: 6866) has grown to become a world leader in providing consistent delivery of test and measuring instruments through advanced design, manufacturing, and sales and services. By offering over 200 main products characterized by safety and quality while meeting an expansive range of applications, we aim to contribute to the efficiency and value of our customers' work in research and development, production and electrical maintenance. HIOKI products and services are available around the world through our extensive network of subsidiaries and distributors. Information about HIOKI is available at https://hiokiusa.com.