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X-Y BOARD HiTESTER 1270, 1271

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X-Y BOARD HiTESTER 1270, 1271

Double-sided Board Tester with Maximum Measurement Speed of 0.012s/Step

SKU: 1270, 1271 Category:

Model No. (Order Code)

1270 50 × 50 to 400 × 330 mm board
1271 50 × 70 to 610 × 510 mm board

 

Description

The 1270 and 1271 are fixtureless, dual-sided, bare board testers that provide superior cost performance. Using a total of four arms, two in front and two in back, it is capable of simultaneously testing both sides of an optional board, and is available with a4-terminal resistance measurement function that enables measurement of very small resistances in IVH or through holes.

Key Features

• Double-sided, simultaneous testing with a total of 4 arms (2 front, 2 back)
• Detection of invisible defects such as cracks thank to a pin low-resistance measurement function (optional feature)
• Extensive testing capabilities in addition to continuity testing and capacitance measurement:
Short and break testing using the insulation and continuity testing method
Short and break testing using the CR testing method
Short and break testing using the capacitance measurement method
Resistance testing of IVHs and through-holes (optional 4-terminal low-resistance measurement)
Measurement of constants of embedded elements with L, C, R, and D measurement
• High-speed testing at up to 0.012 sec./step while maintaining a high level of precision
• High resolution of 5 aF to ensure reliable detection of minute changes in capacitance caused by defects (1 aF = 10^-6 pF)
• Reliable probing of fine-pitch minute pads thanks to a minimum pad diameter of 20 μm
• Support for insulation dielectric strength testing with test voltages of up to 250 V (optional feature)
• High-speed soft landing function and shock-absorbing probes to minimize probe impact marks
• Automation of operations required in order to acquire test reference values and simple acquisition of basic data

 

 

Specifications overview

  1270 1271
Number of arms 4 (2 front, 2 back)
Number of test steps Max. 40,000 (during continuous testing, 300,000)
Measurement time Max. 84 steps/sec. (0.1 mm movements, simultaneous probing with 4 arms, capacitance measurement)
Minimum pad diameter φ 20 μm
Probe working area 394 mm (15.51 in) W × 324 mm (12.76 in) D 604 mm (23.78 in) W × 504 mm (19.84 in) D
Clampable/transportable board dimensions Thickness: 0.6 mm (0.02 in) to 3.2 mm (0.13 in)
  50 mm (1.97 in) W × 50 mm (1.97 in) H to 400 mm (15.75 in) × 330 mm (12.99 in) H 50 mm (1.97 in) W × 70 mm (2.76 in) H to 610 mm (24.02 in) × 510 mm (20.08 in) H
Power supply 200 V AC ±10% (single-phase), 50/60 Hz, 3 kVA
Dimensions and mass 1,500 mm (59.06 in) W × 1,800 mm (70.87 in) H × 860 mm (33.86 in) D, 1,000 kg (35,273.4 oz) 1,760 mm (69.29 in) W × 2,000 mm (78.74 in) H × 860 mm (33.86 in) D, 1,200 kg (42,328.0 oz)

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