Bare Board Testing (flying probe tester)

  • Dedicated visualization software for Hioki electrical testing equipment and data creation systems

Robust Support for Repair Work Using Simple Operations and Assistive Functionality

FAIL VISUALIZER UA1782

  • 3-in-1 for editing, test-point generation, and built-in component support New Windows-optimized algorithm Free from data volume restrictions for increased freedom Added new commands to reduce data generation time by half

1/2 Data Generation Time With New Platform

FEB-LINE INSPECTION DATA CREATION SYSTEM UA1781

  • Reduced-impact link probes CP1072-01(option) Laser height-adjustment Unit FA1950-06(option) Reduced fine pattern test times High-speed pattern testing using capacitance measurement

High-speed Testing at Up to 100 Points/sec. with Half the Impact Mark Depth

FLYING PROBE TESTER FA1116

  • High-precision probing Max.100 steps/s ultra-high speed inspection Reliable clamping of thin boards

Robust Support for Testing Boards with Embedded Passive and Active Devices through High-Speed, Double-Sided Testing

FLYING PROBE TESTER FA1282

  • High-precision probing Max.100 points/s ultra-high speed inspection

Complete Electrical Testing of High-Function Boards with a Single Unit

FLYING PROBE TESTER FA1283

  • Double-sided bare board testing 0.012s/step measurement speed

Double-sided Board Tester with Maximum Measurement Speed of 0.012s/Step

X-Y BOARD HiTESTER 1270, 1271

Bare Board Testing with test fixture

  • Emdedded passives/actives test HDI via resistance Known-good reference values for wiring pattern resistance

All-In-One Solution for Testing the Reliability of Connections on Printed Circuit Boards

BARE BOARD HiTESTER 1230

  • Double-sided alignment and built-in handler

Semiconductor Package Board Testing System Utilizing Index Table Method

BARE BOARD HiTESTER 1231

  • Double-sided alignment 340 × 330 mm working area

High-Precision Batch Fixture-Type Testing System that Support Boards with Embedded Passive and Active Devices

BARE BOARD TESTER 1232

Robust Support for Testing Device Embedded Substrates

BARE BOARD TESTER FA1232

Data Creation Software

  • 3-in-1 for editing, test-point generation, and built-in component support New Windows-optimized algorithm Free from data volume restrictions for increased freedom Added new commands to reduce data generation time by half

1/2 Data Generation Time With New Platform

FEB-LINE INSPECTION DATA CREATION SYSTEM UA1781

  • Generate high-quality board testing data without physical boards

90% Faster Data Generation, 93% Lower Line Stoppage Times

FIT-LINE INSPECTION DATA CREATION SYSTEM UA1780

Populated Board Testing

  • Dedicated visualization software for Hioki electrical testing equipment and data creation systems

Robust Support for Repair Work Using Simple Operations and Assistive Functionality

FAIL VISUALIZER UA1782

  • Quickly complete programs that take into account component height Automatic calculation of arm interference

Reduce Data Creation Time by a Factor of 10 and Slash Line Stoppage Time by a Factor of 15

FLYING PROBE TESTER FA1240-5x

  • Quickly complete programs that take into account component height Automatic calculation of arm interference

Flying Probe In-circuit Tester

FLYING PROBE TESTER FA1240-6x

  • In-circuit test
  • 4-terminal testing
  • High-current/high-voltage diode testing
  • Impedance
  • High-speed testing of multi-board layouts

High Performance Populated Board Testing with Expansion Capabilities

IN-CIRCUIT HiTESTER 1220

The Power to Connect

Continuing to create new solutions together

A T E  Concept The Power to Connect